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Poster: Identification of Methods with Low Fault Risk

, , and . ICSE '18 : Proceedings 2018 IEEE/ACM 40th International Conference on Software Engineering : Companion Proceedings, page 390-391. IEEE, (2018)
DOI: 10.1145/3183440.3195022

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Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk., , and . PeerJ PrePrints, (2018)Identification of methods with low fault risk, , and . Proceedings of the 40th International Conference on Software Engineering: Companion Proceeedings (ICSE '18), page 390-391. ACM, (2018)Is Static Analysis Able to Identify Unnecessary Source Code?, , , and . ACM Transactions on Software Engineering and Methodology, 29 (1): 1-23 (2020)Ticket Coverage: Putting Test Coverage into Context., , , and . WETSoM@ICSE, page 2-8. IEEE, (2017)Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk., , and . PeerJ Computer Science, (2019)Is the Stack Distance Between Test Case and Method Correlated with Test Effectiveness?, and . EASE '19: Proceedings of the Evaluation and Assessment on Software Engineering, page 189-198. ACM, (2019)Evaluation and improvement of automated software test suites. Universität Stuttgart, Stuttgart, Dissertation, (2019)TEAMSCALE : Tackle Technical Debt and Control the Quality of Your Software, , and . 2019 IEEE/ACM International Conference on Technical Debt : TechDebt 2019, page 55-56. IEEE, (2019)Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk, , and . PeerJ Computer Science, (2019)Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk, , and . Software Engineering 2020, page 137-138. Gesellschaft für Informatik e.V., (2020)