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Disambiguation of "Hayashi, Terumine"

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Obstacle to training SpikeProp networks - Cause of surges in training process -.

, , , , , and . IJCNN, page 3062-3066. IEEE Computer Society, (2009)

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Other publications of authors with the same name

Descriptive Answer Clustering System for Immediate Feedback., , , , and . ICCE, volume 162 of Frontiers in Artificial Intelligence and Applications, page 37-40. IOS Press, (2007)A Method for Evaluating Upper Bound of Simultaneous Switching Gates Using Circuit Partition., , , and . ASP-DAC, page 291-294. IEEE Computer Society, (1999)Cyclic greedy generation method for limited number of IDDQ tests., , and . Asian Test Symposium, page 362-. IEEE Computer Society, (2000)Enhancing both generalization and fault tolerance of multilayer neural networks., , , and . IJCNN, page 1429-1433. IEEE, (2007)Manipulation of hidden units activities for fault tolerant multi-layer neural networks., , , and . CIRA, page 19-24. IEEE, (2003)Shape of error surfaces in SpikeProp., , , and . IJCNN, page 840-844. IEEE, (2008)Fault tolerant training algorithm for multi-layer neural networks focused on hidden unit activities., , and . IJCNN, page 1540-1545. IEEE, (2006)Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL., , and . Asian Test Symposium, page 16-21. IEEE Computer Society, (1997)A Parallel Generation System of Compact IDDQ Test Sets for Large Combinational Circuits., and . Asian Test Symposium, page 164-. IEEE Computer Society, (1999)Sequential circuit test generation by real number simulation., , , and . Systems and Computers in Japan, 24 (9): 64-75 (1993)