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Disambiguation of "Cerdeira, Antonio"

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Drain current model for short-channel triple gate junctionless nanowire transistors.

, , , , , , , and . Microelectronics Reliability, (2016)

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Antonio Raiolo University of Stuttgart

Giuliano Antonio Giacoppo University of Stuttgart

Rafael Antonio Lainez Reyes University of Stuttgart

Jesus Antonio Martinez Zarate University of Stuttgart

 

Other publications of authors with the same name

Implementation of nanoscale double-gate CMOS circuits using compact advanced transport models., , , , , , and . Microelectronics Journal, 44 (2): 80-85 (2013)Modeling the subthreshold region of OTFTs., , , and . CCE, page 1-4. IEEE, (2011)Drain current model for short-channel triple gate junctionless nanowire transistors., , , , , , , and . Microelectronics Reliability, (2016)Harmonic distortion analysis using an improved charge sheet model for PD SOI MOSFETs., , , and . Microelectronics Journal, 38 (3): 321-326 (2007)DC self-heating effects modelling in SOI and bulk FinFETs., , , , and . Microelectronics Journal, 46 (4): 320-326 (2015)Using Data Mining for Wine Quality Assessment., , , , , and . Discovery Science, volume 5808 of Lecture Notes in Computer Science, page 66-79. Springer, (2009)Determination of trap cross-section in a-Si: H p-i-n diodes parameters using simulation and parameter extraction., , , and . Microelectronics Reliability, 41 (4): 605-610 (2001)Characterization of MIS structures and PTFTs using TiOx deposited by spin-coating., , , , , , and . Microelectronics Reliability, 54 (5): 893-898 (2014)Effect of interface charge on the dc bias stress-induced deformation and shift of the transfer characteristic of amorphous oxide thin-film transistors., , and . Microelectronics Reliability, 52 (7): 1342-1345 (2012)Harmonic distortion analysis of double gate graded-channel MOSFETs operating in saturation., , , , and . Microelectronics Journal, 39 (12): 1663-1670 (2008)