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Disambiguation of "Chandra, Anshuman"

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Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes.

, , , , and . DFT, page 298-305. IEEE Computer Society, (2004)

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Chandra Prakash Beura University of Stuttgart

 

Other publications of authors with the same name

Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Teste., , , , and . Asian Test Symposium, page 440-445. IEEE Computer Society, (2003)Breaking the Test Application Time Barriers in Compression: Adaptive Scan-Cyclical (AS-C)., , and . Asian Test Symposium, page 432-437. IEEE Computer Society, (2011)Designing effective scan compression solutions for industrial circuits., , and . ISQED, page 167-172. IEEE, (2015)Proactive management of X's in scan chains for compression., , and . ISQED, page 260-265. IEEE Computer Society, (2009)Interval Based X-Masking for Scan Compression Architectures., and . ISQED, page 821-826. IEEE Computer Society, (2008)Test data compression and decompression based on internal scanchains and Golomb coding., and . IEEE Trans. on CAD of Integrated Circuits and Systems, 21 (6): 715-722 (2002)Response compaction for system-on-a-chip based on advanced convolutional codes., , , and . Science in China Series F: Information Sciences, 49 (2): 262-272 (2006)Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores., , , , , and . IEICE Transactions, 88-D (9): 2126-2134 (2005)A Uni.ed SOC Test Approach Based on Test Data Compression and TAM Design., and . DFT, page 511-518. IEEE Computer Society, (2003)Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes., , , and . IEEE Trans. Instrumentation and Measurement, 55 (2): 389-399 (2006)