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Disambiguation of "Ricchetti, Mike"

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Special panel session IIB: "System validation and silicon debug - Is standardization possible?".

, , , , , , and . VTS, page 1. IEEE Computer Society, (2016)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Mike Söhner University of Stuttgart

Mike Kornely University of Stuttgart

Mike Kopp University of Stuttgart

Mike Holz University of Stuttgart

Mike Hartmann University of Stuttgart

 

Other publications of authors with the same name

A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems., and . ITC, page 857-866. IEEE Computer Society, (2004)Special panel session IIB: "System validation and silicon debug - Is standardization possible?"., , , , , , and . VTS, page 1. IEEE Computer Society, (2016)Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer?, , , , , , and . VTS, page 445-446. IEEE Computer Society, (2002)Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard., , and . ITC, page 980-989. IEEE Computer Society, (1998)Evolution of Graphics Northbridge Test and Debug Architectures Across Four Generations of AMD ASICs., , , and . IEEE Design & Test, 30 (4): 16-25 (2013)IEEE 1149.6 - A Practical Perspective., , , and . ITC, page 494-502. IEEE Computer Society, (2003)Innovative practices session 3C: Advances in silicon debug & diagnosis.. VTS, page 1. IEEE Computer Society, (2015)On IEEE P1500's Standard for Embedded Core Test., , , , , and . J. Electronic Testing, 18 (4-5): 365-383 (2002)IP and Automation to Support IEEE P1500., , , , , and . VTS, page 411-412. IEEE Computer Society, (2001)Infrastructure IP for Configuration and Test of Boards and Systems., and . IEEE Design & Test of Computers, 20 (3): 78-87 (2003)