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Disambiguation of "Castro-López, Rafael"

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An IC Array for the Statistical Characterization of Time-Dependent Variability of Basic Circuit Blocks.

, , , , , , , and . SMACD, page 241-244. IEEE, (2019)

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Dr. -Ing. Juan Santiago López Bermúdez University of Stuttgart

Rafael Sendek University of Stuttgart

Rafael Horn University of Stuttgart

Rafael Jarosch

Rodrigo Lopez Portillo Alcocer University of Stuttgart

 

Other publications of authors with the same name

Experimental Characterization of Time-Dependent Variability in Ring Oscillators., , , , , , and . SMACD, page 229-232. IEEE, (2019)Two-Step RF IC Block Synthesis With Preoptimized Inductors and Full Layout Generation In-the-Loop., , , , , , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 38 (6): 989-1002 (2019)Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology., , , , , , , , , and 2 other author(s). PATMOS, page 82-87. IEEE, (2018)Stopping criteria in evolutionary algorithms for multi-objective performance optimization of integrated inductors., , , and . IEEE Congress on Evolutionary Computation, page 1-8. IEEE, (2010)Adaptive CMOS analog circuits for 4G mobile terminals - Review and state-of-the-art survey., , , , , , and . Microelectronics Journal, 40 (1): 156-176 (2009)Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability., , , , , , , , , and . IRPS, page 6-1. IEEE, (2018)CMOS Characterization and Compact Modelling for Circuit Reliability Simulation., , , , , , and . IOLTS, page 139-142. IEEE, (2018)A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI., , , , , , , , , and . J. Solid-State Circuits, 54 (2): 476-488 (2019)A 0.13 µm CMOS adaptive sigma-delta modulator for triple-mode GSM/Bluetooth/UMTS applications., , , , and . Microelectronics Journal, 41 (5): 277-290 (2010)High-level optimization of ΣΔ modulators using multi-objetive evolutionary algorithms., , and . ISCAS, page 1494-1497. IEEE, (2016)