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Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization

, , , , , and . 2022 IEEE European Test Symposium (ETS), Piscataway, IEEE, (2022)
DOI: 10.1109/ETS54262.2022.9810416

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Exploiting an I-IP for In-Field SOC Test., , and . DFT, page 404-412. IEEE Computer Society, (2004)An experimental analysis of the effectiveness of the circular self-test path technique., , and . EURO-DAC, page 246-251. IEEE Computer Society, (1994)Software-Based Testing for System Peripherals., , , , , and . J. Electronic Testing, 28 (2): 189-200 (2012)Verifying Reliability (Dagstuhl Seminar 12341)., , , , and . Dagstuhl Reports, 2 (8): 57-73 (2012)An Exact and Efficient Critical Path Tracing Algorithm., , , , and . DELTA, page 164-169. IEEE Computer Society, (2010)A Source-to-Source Compiler for Generating Dependable Software., , , and . SCAM, page 35-44. IEEE Computer Society, (2001)Validation of the dependability of CAN-based networked systems., , , , and . HLDVT, page 161-164. IEEE Computer Society, (2004)An RT-level fault model with high gate level correlation., , , and . HLDVT, page 3-8. IEEE Computer Society, (2000)A hierarchical approach for designing dependable systems., , , , , and . HLDVT, page 63-68. IEEE Computer Society, (2002)An improved cellular automata-based BIST architecture for sequential circuits., , and . ISCAS, page 76-79. IEEE, (2000)