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Inkjet-Printed EGFET-Based Physical Unclonable Function - Design, Evaluation, and Fabrication.

, , , , , , and . IEEE Trans. VLSI Syst., 26 (12): 2935-2946 (2018)

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Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications., , , , , , and . ITC, page 1-10. IEEE, (2018)Aging guardband reduction through selective flip-flop optimization., , , and . ETS, page 1-6. IEEE, (2015)Inkjet-Printed EGFET-Based Physical Unclonable Function - Design, Evaluation, and Fabrication., , , , , , and . IEEE Trans. VLSI Syst., 26 (12): 2935-2946 (2018)Analysis and optimization of flip-flops under process and runtime variations., , , and . ISQED, page 191-196. IEEE, (2015)A cross-layer approach for resiliency and energy efficiency in near threshold computing., , , , and . ICCAD, page 71. ACM, (2016)Hold-time violation analysis and fixing in near-threshold region., , and . PATMOS, page 50-55. IEEE, (2016)Runtime adjustment of IoT system-on-chips for minimum energy operation., and . DAC, page 145:1-145:6. ACM, (2018)Fault injection acceleration by simultaneous injection of non-interacting faults., , , and . DAC, page 25:1-25:6. ACM, (2016)Variation-aware near threshold circuit synthesis., , , and . DATE, page 1237-1242. IEEE, (2016)Optimizing Datapaths for Near Threshold Computing., and . SMACD, page 69-72. IEEE, (2018)