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Reliable FeFET-based Neuromorphic Computing through Joint Modeling of Cycle-to-Cycle Variability, Device-to-Device Variability, and Domain Stochasticity

S. Thomann, A. Mema, K. Ni, and H. Amrouch. 2023 IEEE International Reliability Physics Symposium (IRPS), IEEE, (2023)
DOI: 10.1109/IRPS48203.2023.10117810

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Simon Thomann University of Stuttgart

Hon. -Prof. Dr. -Ing. Volker Simon University of Stuttgart

Univ. -Prof. Dr. -Ing. Sven Simon University of Stuttgart

Adina Lucia Simonovic University of Stuttgart

Sara Simonovska University of Stuttgart

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