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Resource Allocation and Test Scheduling for Concurrent Test of Core-Based SoC D.

Y. Huang, W. Cheng, C. Tsai, N. Mukherjee, O. Samman, Y. Zaidan, and S. Reddy. Asian Test Symposium, page 265-. IEEE Computer Society, (2001)

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High Performance Dense Ring Generators.G. Mrugalski, N. Mukherjee, J. Rajski, and J. Tyszer. IEEE Trans. Computers, 55 (1): 83-87 (2006)EDT Bandwidth Management in SoC Designs.J. Janicki, M. Kassab, G. Mrugalski, N. Mukherjee, J. Rajski, and J. Tyszer. IEEE Trans. on CAD of Integrated Circuits and Systems, 31 (12): 1894-1907 (2012)High Volume Diagnosis in Memory BIST Based on Compressed Failure Data.N. Mukherjee, A. Pogiel, J. Rajski, and J. Tyszer. IEEE Trans. on CAD of Integrated Circuits and Systems, 29 (3): 441-453 (2010)Versatile BIST: an integrated approach to on-line/off-line BIST.R. Karri, and N. Mukherjee. ITC, page 910-917. IEEE Computer Society, (1998)Chasing subtle embedded RAM defects for nanometer technologies.T. Powell, A. Kumar, J. Rayhawk, and N. Mukherjee. ITC, page 9. IEEE Computer Society, (2005)Embedded deterministic test points for compact cell-aware tests.C. Acero, D. Feltham, F. Hapke, E. Moghaddam, N. Mukherjee, V. Neerkundar, M. Patyra, J. Rajski, J. Tyszer, and J. Zawada. ITC, page 1-8. IEEE, (2015)Reduced ATE Interface for High Test Data Compression.D. Czysz, G. Mrugalski, N. Mukherjee, J. Rajski, and J. Tyszer. European Test Symposium, page 99-104. IEEE Computer Society, (2011)New test compression scheme based on low power BIST.J. Tyszer, M. Filipek, G. Mrugalski, N. Mukherjee, and J. Rajski. ETS, page 1-6. IEEE Computer Society, (2013)Embedded deterministic test.J. Rajski, J. Tyszer, M. Kassab, and N. Mukherjee. IEEE Trans. on CAD of Integrated Circuits and Systems, 23 (5): 776-792 (2004)Innovative practices session 11C: Advanced scan methodologies 3 presentations.J. Rajski, and N. Mukherjee. VTS, page 1. IEEE Computer Society, (2015)

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Resource Allocation and Test Scheduling for Concurrent Test of Core-Based SoC D.

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Resource Allocation and Test Scheduling for Concurrent Test of Core-Based SoC D.