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Disambiguation of "Huang, Li-Ren"

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A design for testability of non-volatile memory reliability test for automotive embedded processor.

, , , , , and . APCCAS, page 372-375. IEEE, (2012)

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Weibo Ren University of Stuttgart

M.Sc. Yunxuan Li University of Stuttgart

Yu Li University of Stuttgart

Zhenxiang Huang University of Stuttgart

Jingjing Huang University of Stuttgart

 

Other publications of authors with the same name

Parametric Fault Testing and Performance Characterization of Post-Bond Interposer Wires in 2.5-D ICs., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 33 (3): 476-488 (2014)10 Gb/s CMOS laser driver with 3.3 V/sub pp/ output swing., , and . CICC, page 333-336. IEEE, (2005)Mid-bond Interposer Wire Test., , , , and . Asian Test Symposium, page 153-158. IEEE Computer Society, (2013)Delay testing and characterization of post-bond interposer wires in 2.5-D ICs., , , and . ITC, page 1-8. IEEE Computer Society, (2013)FMEDA-Based Fault Injection and Data Analysis in Compliance with ISO-26262., , and . DSN Workshops, page 275-278. IEEE Computer Society, (2018)Invited - Wireless sensor nodes for environmental monitoring in internet of things., , , , , , , , , and . DAC, page 3:1-3:5. ACM, (2016)Programmable Leakage Test and Binning for TSVs With Self-Timed Timing Control., , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 32 (8): 1265-1273 (2013)Assessing automotive functional safety microprocessor with ISO 26262 hardware requirements., , , , and . VLSI-DAT, page 1-4. IEEE, (2014)A design for testability of non-volatile memory reliability test for automotive embedded processor., , , , , and . APCCAS, page 372-375. IEEE, (2012)A Class-D amplifier powered by embedded single-inductor bipolar-output power module with low common noise and dynamic voltage boosting technique., , , , , , , , , and . ESSCIRC, page 315-318. IEEE, (2014)