PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Nouet, Pascal"

Author of the publication

copydeleteadd this publication to your clipboard
Automated Diagnosis and Probing Flow for Fast Fault Localization in IC.

, , , , and . Microelectronics Reliability, 44 (9-11): 1553-1558 (2004)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Pascal Heinzelmann University of Stuttgart

Pascal Gröger University of Stuttgart

Pascal Strobel University of Stuttgart

Pascal Goldschmid University of Stuttgart

Pascal Jaufmann University of Stuttgart

 

Other publications of authors with the same name

Sensitivity and power modeling of CMOS mems single axis convective accelerometers., , , , , and . Microelectronics Journal, 44 (12): 1092-1098 (2013)A CMOS Multi-sensor System for 3D Orientation Determination., , , , and . ISVLSI, page 57-62. IEEE Computer Society, (2008)An electrical test method for MEMS convective accelerometers: Development and evaluation., , , , and . DATE, page 806-811. IEEE, (2011)Rejection of Power Supply Noise in Wheatstone Bridges : Application to Piezoresistive MEMS, , , , and . CoRR, (2008)Per peers learning educational approach to teach industrial test to undergraduate students., , and . EWME, page 1-6. IEEE, (2016)A Closed-Loop Architecture with Digital Output for Convective Accelerometers., , , and . ISVLSI, page 51-56. IEEE Computer Society, (2008)Test and Testability of a Monolithic MEMS for Magnetic Field Sensing., , , and . J. Electronic Testing, 17 (5): 439-450 (2001)Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems., , , and . VTS, page 439-444. IEEE Computer Society, (2002)Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing., , , and . VLSI-SOC, volume 218 of IFIP Conference Proceedings, page 461-472. Kluwer, (2001)A novel method for test and calibration of capacitive accelerometers with a fully electrical setup., , , , and . DDECS, page 304-309. IEEE Computer Society, (2008)