Author of the publication

Multi-stage dual replica bit-line delay technique for process-variation-robust timing of low voltage SRAM sense amplifier.

, , , , , and . Frontiers of IT & EE, 16 (8): 700-706 (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Erratum: A novel cascade control replica-bitline delay technique for reducing timing process-variation of SRAM sense amplifier IEICE Electronics Express Vol 12 (2015) No 5 pp 20150102., , , , , , and . IEICE Electronic Express, 12 (7): 20158001 (2015)In-Memory Multibit Multiplication Based on Bitline Shifting., , , , , , , , and . IEEE Trans. Circuits Syst. II Express Briefs, 69 (2): 354-358 (2022)Additive-calibration scheme for leakage compensation of low voltage SRAM., , , , and . IEICE Electronic Express, 13 (18): 20160720 (2016)Human dynamics in mobile social networks: A study of inter-node relationships., , , and . FSKD, page 806-810. IEEE, (2015)Multi-stage dual replica bit-line delay technique for process-variation-robust timing of low voltage SRAM sense amplifier., , , , , and . Frontiers of IT & EE, 16 (8): 700-706 (2015)Variation-resilient pipelined timing tracking circuit for SRAM sense amplifier., , , , , , and . IEICE Electronic Express, 13 (7): 20150951 (2016)Radiation-Hardened 14T SRAM Bitcell With Speed and Power Optimized for Space Application., , , , , , , , and . IEEE Trans. VLSI Syst., 27 (2): 407-415 (2019)Read/write margin enhanced 10T SRAM for low voltage application., , , , and . IEICE Electronic Express, 13 (12): 20160382 (2016)Image-to-class distance ratio: A feature filtering metric for image classification., , , and . Neurocomputing, (2015)Offset voltage suppressed sense amplifier with self-adaptive distribution transformation technique., , , , , , and . IEICE Electronic Express, 15 (10): 20180332 (2018)