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Solutions for the self-adaptation of communicating systems in operation.

M. Andraud, A. Deluthault, M. Dieng, F. Azaïs, S. Bernard, P. Cauvet, M. Comte, T. Kervaon, V. Kerzerho, S. Mir, P. Pugliesi-Conti, M. Renovell, F. Soulier, E. Simeu, and H. Stratigopoulos. IOLTS, page 234-239. IEEE, (2014)

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Jun. -Prof. Dr. Philippe Grönquist University of Stuttgart

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Solutions for the self-adaptation of communicating systems in operation.M. Andraud, A. Deluthault, M. Dieng, F. Azaïs, S. Bernard, P. Cauvet, M. Comte, T. Kervaon, V. Kerzerho, S. Mir and 5 other author(s). IOLTS, page 234-239. IEEE, (2014)Diagnosis of assembly failures for System-in-Package RF tuners.E. Erdogan, S. Ozev, and P. Cauvet. ISCAS, page 2286-2289. IEEE, (2008)A First Step for an INL Spectral-Based BIST: The Memory Optimization.V. Kerzerho, S. Bernard, P. Cauvet, and J. Janik. J. Electronic Testing, 22 (4-6): 351-357 (2006)Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC.V. Kerzerho, P. Cauvet, S. Bernard, F. Azaïs, M. Comte, and M. Renovell. IET Computers & Digital Techniques, 1 (3): 146-153 (2007)Änalogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC.V. Kerzerho, P. Cauvet, S. Bernard, F. Azaïs, M. Comte, and M. Renovell. European Test Symposium, page 159-164. IEEE Computer Society, (2006)Efficient Objective Metric Tool for Medical Electrical Device Development: Eye Phantom for Glaucoma Diagnosis Device.A. Deluthault, L. Mezenge, P. Cauvet, V. Kerzerho, F. Soulier, and S. Bernard. J. Sensors, (2017)Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing.E. Simeu, H. Nguyen, P. Cauvet, S. Mir, L. Rufer, and R. Khereddine. VLSI Design, (2008)System-in-Package, a Combination of Challenges and Solutions.P. Cauvet, S. Bernard, and M. Renovell. European Test Symposium, page 193-199. IEEE Computer Society, (2007)ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator.V. Kerzerho, P. Cauvet, S. Bernard, F. Azaïs, M. Renovell, M. Comte, and O. Chakib. VLSI Design, (2008)High throughput non-contact SiP testing.B. Moore, C. Sellathamby, P. Cauvet, H. Fleury, M. Paulson, M. Reja, L. Fu, B. Bai, E. Reid, I. Filanovsky and 1 other author(s). ITC, page 1-10. IEEE Computer Society, (2007)

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Disambiguation of "Cauvet, Philippe"

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Solutions for the self-adaptation of communicating systems in operation.

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Jun. -Prof. Dr. Philippe Grönquist University of Stuttgart

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Disambiguation of "Cauvet, Philippe"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Solutions for the self-adaptation of communicating systems in operation.

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Jun. -Prof. Dr. Philippe Grönquist University of Stuttgart

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Solutions for the self-adaptation of communicating systems in operation.