PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Yi, Maoxiang"

Author of the publication

copydeleteadd this publication to your clipboard
An All-Digital and Jitter-Quantizing True Random Number Generator in SRAM-Based FPGAs.

, , , , , , , and . ATS, page 59-62. IEEE, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Yi Wang University of Stuttgart

Seda Yilmaz University of Stuttgart

Emre Baris Yildiz University of Stuttgart

Zeynep Hazal Yilmaz University of Stuttgart

Yi-Hua Wang University of Stuttgart

 

Other publications of authors with the same name

Optimal LFSR-Coding Test Data Compression Based on Test Cube Dividing., , , and . CSE (2), page 698-702. IEEE Computer Society, (2009)A Novel x -ploiting Strategy for Improving Performance of Test Data Compression., , , and . IEEE Trans. VLSI Syst., 18 (2): 324-329 (2010)A Pulse Shrinking-Based Test Solution for Prebond Through Silicon via in 3-D ICs., , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 38 (4): 755-766 (2019)An Output-Capacitorless Ultra-Low Power Low-Dropout Regulator., , , , , and . Journal of Circuits, Systems, and Computers, 26 (12): 1750193:1-1750193:11 (2017)A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application., , , , , , , and . IEEE Trans. on Circuits and Systems, 66-II (2): 287-291 (2019)A BIST Scheme Based on Selecting State Generation of Folding Counters., , , and . Asian Test Symposium, page 144-149. IEEE Computer Society, (2005)A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology., , , , and . IEICE Transactions, 98-C (12): 1171-1178 (2015)NBTI-induced circuit aging optimization by protectability-aware gate replacement technique., , , , and . LATS, page 1-4. IEEE Computer Society, (2015)Decreasing SoC Test Power Dissipation and Test Data Volume Based on Pattern Recombination., , and . TrustCom, page 701-705. IEEE Computer Society, (2011)A Low-Cost High-Efficiency True Random Number Generator on FPGAs., , , , , , and . ATS, page 54-58. IEEE, (2018)