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Connecting the physical and application level towards grasping aging effects., , , , , , and . IRPS, page 3. IEEE, (2015)A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging., , , , , , , , , and . SMACD, page 1-4. IEEE, (2017)An IC Array for the Statistical Characterization of Time-Dependent Variability of Basic Circuit Blocks., , , , , , , and . SMACD, page 241-244. IEEE, (2019)TARS: A toolbox for statistical reliability modeling of CMOS devices., , , , , , and . SMACD, page 1-4. IEEE, (2017)Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models., , , , , , , , , and 2 other author(s). SMACD, page 73-76. IEEE, (2018)Lifetime Calculation Using a Stochastic Reliability Simulator for Analog ICs., , , , , , , and . SMACD, page 1-9. IEEE, (2018)Designing guardbands for instantaneous aging effects., , , , and . DAC, page 69:1-69:6. ACM, (2016)A shapeshifting evolvable hardware mechanism based on reconfigurable memFETs crossbar architecture., , , , , and . Microelectronics Reliability, 54 (8): 1500-1510 (2014)Resistive switching like-behavior in MOSFETs with ultra-thin HfSiON dielectric gate stack: pMOS and nMOS comparison and reliability implications., , , , and . Microelectronics Reliability, 53 (9-11): 1247-1251 (2013)Reliability simulation for analog ICs: Goals, solutions, and challenges., , , , , , , and . Integration, (2016)