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Negative ESD robustness of a novel anti-ESD TGFPTD SOI LDMOS., , , , , , and . APCCAS, page 1227-1230. IEEE, (2010)At-Speed Current Testing., , and . Asian Test Symposium, page 396-399. IEEE Computer Society, (2003)Research on Multimedia Teaching in Universities Under Human-Computer Interaction Environment.. HCI (LBP), volume 11786 of Lecture Notes in Computer Science, page 330-340. Springer, (2019)