%0 Conference Paper %1 conf/apccas/ZhangZWLLNF10 %A Zhang, Haipeng %A Zhang, Liang %A Wang, Dejun %A Liu, Guohua %A Lin, Mi %A Niu, Xiaoyan %A Fan, Lingyan %B APCCAS %D 2010 %I IEEE %K dblp %P 1227-1230 %T Negative ESD robustness of a novel anti-ESD TGFPTD SOI LDMOS. %U http://dblp.uni-trier.de/db/conf/apccas/apccas2010.html#ZhangZWLLNF10 %@ 978-1-4244-7454-7

@inproceedings{conf/apccas/ZhangZWLLNF10, added-at = {2014-02-19T00:00:00.000+0100}, author = {Zhang, Haipeng and Zhang, Liang and Wang, Dejun and Liu, Guohua and Lin, Mi and Niu, Xiaoyan and Fan, Lingyan}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f32676ce12623b5406158e48477cda7b/dblp}, booktitle = {APCCAS}, crossref = {conf/apccas/2010}, ee = {http://dx.doi.org/10.1109/APCCAS.2010.5775049}, interhash = {4141890380dae201f212989642dfd785}, intrahash = {f32676ce12623b5406158e48477cda7b}, isbn = {978-1-4244-7454-7}, keywords = {dblp}, pages = {1227-1230}, publisher = {IEEE}, timestamp = {2016-02-02T14:39:38.000+0100}, title = {Negative ESD robustness of a novel anti-ESD TGFPTD SOI LDMOS.}, url = {http://dblp.uni-trier.de/db/conf/apccas/apccas2010.html#ZhangZWLLNF10}, year = 2010 }