Author of the publication

Aging Adaption in Integrated Circuits Using a Novel Built-In Sensor.

, , , , , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 34 (1): 109-121 (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Winemberg, LeRoy
add a person with the name Winemberg, LeRoy
 

Other publications of authors with the same name

Design and Analysis of a Delay Sensor Applicable to Process/Environmental Variations and Aging Measurements., , , , and . IEEE Trans. VLSI Syst., 20 (8): 1405-1418 (2012)Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests., , and . VTS, page 1-6. IEEE Computer Society, (2014)Forward prediction based on wafer sort data - A case study., , , , and . ITC, page 1-10. IEEE Computer Society, (2011)LBIST pattern reduction by learning ATPG test cube properties., , , , and . ISQED, page 147-153. IEEE, (2015)A Novel Peak Power Supply Noise Measurement and Adaptation System for Integrated Circuits., , , , and . IEEE Trans. VLSI Syst., 24 (5): 1715-1727 (2016)A robust digital sensor IP and sensor insertion flow for in-situ path timing slack monitoring in SoCs., , and . VTS, page 1-6. IEEE Computer Society, (2015)Understanding customer returns from a test perspective., , , , and . VTS, page 2-7. IEEE Computer Society, (2011)Special session 5B: Panel How much toggle activity should we be testing with?, , , , , and . VTS, page 114. IEEE Computer Society, (2011)Critical Fault-Based Pattern Generation for Screening SDDs., , , , , and . European Test Symposium, page 177-182. IEEE Computer Society, (2011)Outsourcing DFT: it can be done but it isn't easy.. ITC, page 2. IEEE Computer Society, (2005)