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Disambiguation of "Hayes, John P."

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High-Level Test Generation for VLSI.

, , and . IEEE Computer, 22 (4): 16-24 (1989)

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John Nixon University of Stuttgart

Isaac Henderson Johnson Jeyakumar University of Stuttgart

P. Hommel

P. Abegglen

P. Krasteva

 

Other publications of authors with the same name

Transient fault characterization in dynamic noisy environments., , , and . ITC, page 10. IEEE Computer Society, (2005)Fault-Tolerant Quantum Computers.. IPDPS, IEEE Computer Society, (2002)An Analysis Framework for Transient-Error Tolerance., , and . VTS, page 249-255. IEEE Computer Society, (2007)Approximate simulation of circuits with probabilistic behavior., , , and . DFTS, page 95-100. IEEE Computer Society, (2013)Gate Sizing and Vt Assignment for Active-Mode Leakage Power Reduction., and . ICCD, page 258-264. IEEE Computer Society, (2004)Unveiling the ISCAS-85 Benchmarks: A Case Study in Reverse Engineering., , and . IEEE Design & Test of Computers, 16 (3): 72-80 (1999)Tracking Uncertainty with Probabilistic Logic Circuit Testing., , and . IEEE Design & Test of Computers, 24 (4): 312-321 (2007)Online BIST for Embedded Systems., , and . IEEE Design & Test of Computers, 15 (4): 17-24 (1998)High-Performance QuIDD-Based Simulation of Quantum Circuits., , and . DATE, page 1354-1355. IEEE Computer Society, (2004)Designing for high-level test generation., and . IEEE Trans. on CAD of Integrated Circuits and Systems, 9 (7): 752-766 (1990)