Autor der Publikation

A 7 ke-SD-FWC 1.2 e-RMS Temporal Random Noise 128×256 Time-Resolved CMOS Image Sensor With Two In-Pixel SDs for Biomedical Applications.

, und . IEEE Trans. Biomed. Circuits and Systems, 11 (6): 1335-1343 (2017)

Bitte wählen Sie eine Person um die Publikation zuzuordnen

Um zwischen Personen mit demselben Namen zu unterscheiden, wird der akademische Grad und der Titel einer wichtigen Publikation angezeigt. Zudem lassen sich über den Button neben dem Namen einige der Person bereits zugeordnete Publikationen anzeigen.

 

Weitere Publikationen von Autoren mit dem selben Namen

A 10 ps Time-Resolution CMOS Image Sensor With Two-Tap True-CDS Lock-In Pixels for Fluorescence Lifetime Imaging., , , , , , , und . J. Solid-State Circuits, 51 (1): 141-154 (2016)A Time-Resolved Four-Tap Lock-In Pixel CMOS Image Sensor for Real-Time Fluorescence Lifetime Imaging Microscopy., , , , , und . J. Solid-State Circuits, 53 (8): 2319-2330 (2018)A high time-resolution two-tap CMOS lock-in pixel image sensor for time-resolved measurements and its applications., , , , , , und . BioCAS, Seite 460-463. IEEE, (2016)Development of a two-tap time-resolved CMOS lock-in pixel image sensor with high charge storability and low temporal noise., und . BioCAS, Seite 1-4. IEEE, (2017)RTS noise reduction of CMOS image sensors using amplifier-selection pixels., , , , und . IEICE Electronic Express, 10 (15): 20130299 (2013)A Low-Noise High Intrascene Dynamic Range CMOS Image Sensor With a 13 to 19b Variable-Resolution Column-Parallel Folding-Integration/Cyclic ADC., , , , , , , , und . J. Solid-State Circuits, 47 (1): 272-283 (2012)A 7 ke-SD-FWC 1.2 e-RMS Temporal Random Noise 128×256 Time-Resolved CMOS Image Sensor With Two In-Pixel SDs for Biomedical Applications., und . IEEE Trans. Biomed. Circuits and Systems, 11 (6): 1335-1343 (2017)RTS Noise and Dark Current White Defects Reduction Using Selective Averaging Based on a Multi-Aperture System., , , , , und . Sensors, 14 (1): 1528-1543 (2014)Noise Reduction Effect of Multiple-Sampling-Based Signal-Readout Circuits for Ultra-Low Noise CMOS Image Sensors., und . Sensors, 16 (11): 1867 (2016)An 80μVrms-temporal-noise 82dB-dynamic-range CMOS Image Sensor with a 13-to-19b variable-resolution column-parallel folding-integration/cyclic ADC., , , , , , , , , und . ISSCC, Seite 400-402. IEEE, (2011)