Author of the publication

Determination of optimal polynomial regression function to decompose on-die systematic and random variations.

, , , and . ASP-DAC, page 518-523. IEEE, (2008)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Nakayama, Noriaki
add a person with the name Nakayama, Noriaki
 

Other publications of authors with the same name

Numerical simulation of neuronal population coding: influences of noise and tuning width on the coding error., and . Biological Cybernetics, 73 (5): 447-456 (1995)Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress., , , , , and . IEICE Transactions, 91-C (7): 1142-1150 (2008)Accurate Array-Based Measurement for Subthreshold-Current of MOS Transistors., , , and . J. Solid-State Circuits, 44 (11): 2977-2986 (2009)Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design., , , , , , , , , and . ASP-DAC, page 179-183. ACM, (2003)Non-parametric statistical static timing analysis: an SSTA framework for arbitrary distribution., , , and . DAC, page 698-701. ACM, (2008)An Evaluation Method of the Number of Monte Carlo STA Trials for Statistical Path Delay Analysis., , , and . IEICE Transactions, 91-A (4): 957-964 (2008)Determination of optimal polynomial regression function to decompose on-die systematic and random variations., , , and . ASP-DAC, page 518-523. IEEE, (2008)Correlation method of circuit-performance and technology fluctuations for improved design reliability., , , , , , , , , and . ASP-DAC, page 39-44. ACM, (2001)A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation., , , , , , and . ISQED, page 21-26. IEEE Computer Society, (2007)On discrete random dopant modeling in drift-diffusion simulations: physical meaning of 'atomistic' dopants., , , and . Microelectronics Reliability, 42 (2): 189-199 (2002)