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Disambiguation of "Kumashiro, Shigetaka"

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Correlation method of circuit-performance and technology fluctuations for improved design reliability.

, , , , , , , , , and . ASP-DAC, page 39-44. ACM, (2001)

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Other publications of authors with the same name

Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress., , , , , and . IEICE Transactions, 91-C (7): 1142-1150 (2008)Asymptotic waveform evaluation for transient analysis of 3-D interconnect structures., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 12 (7): 988-996 (1993)A Continuous-Time Waveform Monitoring Technique for On-Chip Power Noise Measurements in VLSI Circuits., , , , , , , , and . IEICE Transactions, 94-C (4): 495-503 (2011)Correlation method of circuit-performance and technology fluctuations for improved design reliability., , , , , , , , , and . ASP-DAC, page 39-44. ACM, (2001)HiSIM-RP: A reverse-profiling based 1st principles compact MOSFET model and its application to variability analysis of 90nm and 40nm CMOS., , , , and . ISQED, page 553-560. IEEE, (2012)Exhaustive and Systematic Accuracy Verification and Enhancement of STI Stress Compact Model for General Realistic Layout Patterns., , , , , , and . IEICE Transactions, 93-C (8): 1349-1358 (2010)On-Chip In-Place Measurements of Vth and Signal/Substrate Response of Differential Pair Transistors., , , , , , , , and . IEICE Transactions, 95-C (1): 137-145 (2012)Accurate analysis of substrate sensitivity of active transistors in an analog circuit., , , , , , , , and . ISQED, page 56-61. IEEE, (2011)A predictable compact model for non-monotonous Vth-Pelgrom plot of long channel halo-implanted transistors.. ISQED, page 391-397. IEEE, (2013)Non-quasi-static approach with surface-potential-based MOSFET model HiSIM for RF circuit simulations., , , , , , , , , and 2 other author(s). Mathematics and Computers in Simulation, 79 (4): 1096-1106 (2008)