PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Dembélé, Sounkalo"

Author of the publication

copydeleteadd this publication to your clipboard
Toward the Vision Based Supervision of Microfactories Through Images Mosaicing.

, , and . IPAS, volume 198 of IFIP, page 239-250. Springer, (2006)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Dembélé, Sounkalo
add a person with the name Dembélé, Sounkalo
 

Other publications of authors with the same name

Performing Weak Calibration at the Microscale, Application to Micromanipulation., , and . ICRA, page 4937-4942. IEEE, (2007)Automatic micromanipulation using multiscale visual servoing., , , and . CASE, page 977-982. IEEE, (2008)Microassembly of complex and solid 3D MEMS by 3D vision-based control., , , and . IROS, page 3284-3289. IEEE, (2009)A multiscale calibration of a photon video microscope for visual servo control: Application to micromanipulation., , and . ROSE, page 29-34. IEEE, (2008)Visual servoing schemes for automatic nanopositioning under scanning electron microscope., , , and . ICRA, page 981-986. IEEE, (2014)Toward the Vision Based Supervision of Microfactories Through Images Mosaicing., , and . IPAS, volume 198 of IFIP, page 239-250. Springer, (2006)Visual Servoing-Based Depth-Estimation Technique for Manipulation Inside SEM., , , and . IEEE Trans. Instrumentation and Measurement, 65 (8): 1847-1855 (2016)Estimating the 3D orientation of a microgripper by processing the focus data from the images delivered by a videomicroscope., , , and . ROSE, page 58-63. IEEE, (2008)Visual servoing-based approach for efficient autofocusing in scanning electron microscope., , , and . IROS, page 2677-2682. IEEE, (2013)Magnification-continuous static calibration model of a scanning-electron microscope., , , , and . J. Electronic Imaging, 21 (3): 033020 (2012)