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A Technique for Test Coverage Closure Using GoldMine.

, , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 31 (5): 790-803 (2012)

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Towards coverage closure: Using GoldMine assertions for generating design validation stimulus., , , and . DATE, page 173-178. IEEE, (2011)A Coverage Guided Mining Approach for Automatic Generation of Succinct Assertions., , , and . VLSI Design, page 68-73. IEEE Computer Society, (2014)GoldMine: Automatic assertion generation using data mining and static analysis., , , , , and . DATE, page 626-629. IEEE, (2010)Signature Pattern Covering via Local Greedy Algorithm and Pattern Shrink., , , , , and . ICDM, page 330-339. IEEE Computer Society, (2011)Mining Hardware Assertions With Guidance From Static Analysis., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 32 (6): 952-965 (2013)A Technique for Test Coverage Closure Using GoldMine., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 31 (5): 790-803 (2012)Automatic generation of assertions from system level design using data mining., , , and . MEMOCODE, page 191-200. IEEE, (2011)Design automation methodology and rf/analog modeling for rf CMOS and SiGe BiCMOS technologies., , , , , , , , , and 8 other author(s). IBM Journal of Research and Development, 47 (2-3): 139-176 (2003)A Physics-Based Model for a SiC JFET Device Accounting for the Mobility Dependence on Temperature and Electric Field., , , , , , , , , and . IAS, page 1-8. IEEE, (2008)