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Analysis of a Transistor-Based On-State Voltage Measurement Circuit for Condition Monitoring of Power Transistors

, , , and . 2023 IEEE Applied Power Electronics Conference and Exposition (APEC), page 2556-2562. IEEE, (2023)
DOI: 10.1109/APEC43580.2023.10131156

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Hybrid Modelling for the Failure Analysis of SiC Power Transistors on Time-Domain Reflectometry Data, , , , and . 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), IEEE, (2021)Analysis of a Transistor-Based On-State Voltage Measurement Circuit for Condition Monitoring of Power Transistors, , , and . 2023 IEEE Applied Power Electronics Conference and Exposition (APEC), page 2556-2562. IEEE, (2023)Characterization of the Junction Temperature of SiC Power Devices via Quasi-Threshold Voltage as Temperature Sensitive Electrical Parameter, , , , , , and . CIPS 2020; 11th International Conference on Integrated Power Electronics Systems, page 1-6. Berlin, Germany, (March 2020)Accounting for Acquisition Circuit Temperature in Accurate Online Junction Temperature Estimation, , , and . 2021 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe), Piscataway, IEEE, (2021)Simulation-to-Reality based Transfer Learning for the Failure Analysis of SiC Power Transistors, , , , , and . 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), Piscataway, IEEE, (2022)Characterization of Electrical Parameters for Health Monitoring in SiC MOSFETs during AC Power Cycling, , , and . 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA), page 316-321. Piscataway, IEEE, (2021)Closed Loop Junction Temperature Control of Power Transistors for Lifetime Extension, , , , , , , and . 2020 IEEE Applied Power Electronics Conference and Exposition (APEC), page 2955-2955. New Orleans, USA,, (March 2020)Hybrid Model of Power MOSFET for Soft Failures Estimation Based on Time Domain Reflectometry and Machine Learning, , , and . 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023-ECCE Asia), page 1849--1854. IEEE, (2023)Online Monitoring of Degradation Sensitive Electrical Parameters in Inverter Operation for SiC-MOSFETs, , , and . 2021 IEEE Applied Power Electronics Conference and Exposition (APEC), page 1235-1241. Piscataway, IEEE, (2021)Characterization of Online Junction Temperature of the SiC power MOSFET by Combination of Four TSEPs using Neural Network, , , and . 2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe), IEEE, (2022)