%0 Conference Paper %1 kamm2022simulationtoreality %A Kamm, Simon %A Bickelhaupt, Sandra %A Sharma, Kanuj %A Jazdi-Motlagh, Nasser %A Kallfass, Ingmar %A Weyrich, Michael %B 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) %C Piscataway %D 2022 %I IEEE %K %R 10.1109/ETFA52439.2022.9921681 %T Simulation-to-Reality based Transfer Learning for the Failure Analysis of SiC Power Transistors %@ 978-1-6654-9996-5 and 978-1-6654-9997-2

@inproceedings{kamm2022simulationtoreality, added-at = {2023-10-17T14:27:35.000+0200}, address = {Piscataway}, affiliation = {Kamm, S (Corresponding Author), Univ Stuttgart, Inst Ind Automat \& Software Engn, Pfaffenwaldring 47, Stuttgart, Germany. Kamm, Simon; Bickelhaupt, Sandra; Jazdi, Nasser; Weyrich, Michael, Univ Stuttgart, Inst Ind Automat \& Software Engn, Pfaffenwaldring 47, Stuttgart, Germany. Sharma, Kanuj; Kallfass, Ingmar, Univ Stuttgart, Inst Robust Power Semicond Syst, Pfaffenwaldring 47, Stuttgart, Germany.}, author = {Kamm, Simon and Bickelhaupt, Sandra and Sharma, Kanuj and Jazdi-Motlagh, Nasser and Kallfass, Ingmar and Weyrich, Michael}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23c3c3d76baa49d1d19674aa969f7e0a3/unibiblio}, booktitle = {2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)}, doi = {10.1109/ETFA52439.2022.9921681}, interhash = {db3591a67b85c4d917404d172151cfb8}, intrahash = {3c3c3d76baa49d1d19674aa969f7e0a3}, isbn = {{978-1-6654-9996-5} and {978-1-6654-9997-2}}, keywords = {}, language = {eng}, publisher = {IEEE}, research-areas = {Automation \& Control Systems; Engineering}, timestamp = {2023-10-17T12:27:35.000+0200}, title = {Simulation-to-Reality based Transfer Learning for the Failure Analysis of SiC Power Transistors}, unique-id = {WOS:000934103900223}, venue = {Stuttgart}, year = 2022 }