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Testable Programmable Digital Clock Pulse Control Elements.

, and . ITC, page 902-909. IEEE Computer Society, (1993)

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A Test Generation Methodology for High-Performance Computer Chips and Modules., and . ITC, page 826-833. IEEE Computer Society, (1992)Testable Programmable Digital Clock Pulse Control Elements., and . ITC, page 902-909. IEEE Computer Society, (1993)Delay Test: The Next Frontier for LSSD Test Systems., , , , , , , , , and 1 other author(s). ITC, page 578-587. IEEE Computer Society, (1992)AC Test Quality: Beyond Transition Fault Coverage., , , , , , and . ITC, page 568-577. IEEE Computer Society, (1992)Built-In Self-Test: Assuring System Integrity., , , and . IEEE Computer, 29 (11): 39-45 (1996)Extending OPMISR beyond 10x Scan Test Efficiency., , , , , , , , and . IEEE Design & Test of Computers, 19 (5): 65-72 (2002)A SmartBIST Variant with Guaranteed Encoding., , , , , and . Asian Test Symposium, page 325-. IEEE Computer Society, (2001)OPMISR: the foundation for compressed ATPG vectors., , , , , , and . ITC, page 748-757. IEEE Computer Society, (2001)Care Bit Density and Test Cube Clusters: Multi-Level Compression Opportunities.. ICCD, page 320-. IEEE Computer Society, (2003)