%0 Conference Paper %1 conf/itc/KonemannN92 %A Könemann, Bernd %A Noto, Phil %B ITC %D 1992 %I IEEE Computer Society %K dblp %P 826-833 %T A Test Generation Methodology for High-Performance Computer Chips and Modules. %U http://dblp.uni-trier.de/db/conf/itc/itc1992.html#KonemannN92 %@ 0-7803-0760-7

@inproceedings{conf/itc/KonemannN92, added-at = {2019-02-13T00:00:00.000+0100}, author = {Könemann, Bernd and Noto, Phil}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ec61412bc9d538c8d16577f6d81aebe2/dblp}, booktitle = {ITC}, crossref = {conf/itc/1992}, ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.1992.527906}, interhash = {030ae487363ce5a16c04fe098eda19cd}, intrahash = {ec61412bc9d538c8d16577f6d81aebe2}, isbn = {0-7803-0760-7}, keywords = {dblp}, pages = {826-833}, publisher = {IEEE Computer Society}, timestamp = {2019-09-27T17:47:13.000+0200}, title = {A Test Generation Methodology for High-Performance Computer Chips and Modules.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1992.html#KonemannN92}, year = 1992 }