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Disambiguation of "Hayes, John P."

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Testing Memories for Single-Cell Pattern-Sensitive Faults.

. IEEE Trans. Computers, 29 (3): 249-254 (1980)

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John Nixon University of Stuttgart

Isaac Henderson Johnson Jeyakumar University of Stuttgart

P. Hommel

P. Abegglen

P. Krasteva

 

Other publications of authors with the same name

Scalar-Vector Memory Interference in Vector Computers., and . ICPP (1), page 180-187. CRC Press, (1991)Architecture of a Hypercube Supercomputer., , and . ICPP, page 653-660. IEEE Computer Society Press, (1986)Testing Memories for Single-Cell Pattern-Sensitive Faults.. IEEE Trans. Computers, 29 (3): 249-254 (1980)Test Point Placement to Simplify Fault Detection., and . IEEE Trans. Computers, 23 (7): 727-735 (1974)Some Practical Issues in the Design of Fault-Tolerant Multiprocessors., and . IEEE Trans. Computers, 41 (5): 588-598 (1992)Detection of Pattern-Sensitive Faults in Random-Access Memories.. IEEE Trans. Computers, 24 (2): 150-157 (1975)A Fault-Tolerant Communication Scheme for Hypercube Computers., and . IEEE Trans. Computers, 41 (10): 1242-1256 (1992)A 3.6mW 2.4-GHz multi-channel super-regenerative receiver in 130nm CMOS., , and . CICC, page 361-364. IEEE, (2005)An Analysis Framework for Transient-Error Tolerance., , and . VTS, page 249-255. IEEE Computer Society, (2007)The input pattern fault model and its application., and . ED&TC, page 628. IEEE Computer Society, (1997)