%0 Journal Article %1 journals/tc/Hayes80 %A Hayes, John P. %D 1980 %J IEEE Trans. Computers %K dblp %N 3 %P 249-254 %T Testing Memories for Single-Cell Pattern-Sensitive Faults. %U http://dblp.uni-trier.de/db/journals/tc/tc29.html#Hayes80 %V 29

@article{journals/tc/Hayes80, added-at = {2015-12-22T00:00:00.000+0100}, author = {Hayes, John P.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/261bd3be8f5c1a09676d5cb79af1d488a/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TC.1980.1675556}, interhash = {1a968967e91c182c9b130d244f57f0b1}, intrahash = {61bd3be8f5c1a09676d5cb79af1d488a}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 3, pages = {249-254}, timestamp = {2016-02-02T02:38:25.000+0100}, title = {Testing Memories for Single-Cell Pattern-Sensitive Faults.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc29.html#Hayes80}, volume = 29, year = 1980 }