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Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology

H. Hooshmand, P. Hansen, L. Fu, A. Birk, M. Karamehmedović, P. Lehmann, S. Reichelt, R. Leach, and S. Piano. Journal of computational physics, 521 (1): 113519 (2024)
DOI: 10.1016/j.jcp.2024.113519

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Richard Powers University of Stuttgart

Univ. -Prof. Dr. Richard Dipper University of Stuttgart

Richard Gozali University of Stuttgart

Richard Völker University of Stuttgart

Dr. -Ing. Richard Junesch University of Stuttgart

Other publications of authors with the same name

Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer LevelY. Arezki, R. Su, V. Heikkinen, F. Leprete, P. Posta, Y. Bitou, C. Schober, C. Mehdi-Souzani, B. Alzahrani, X. Zhang and 7 other author(s). Sensors, 21 (4): 1103 (2021)Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrologyH. Hooshmand, T. Pahl, P. Hansen, L. Fu, A. Birk, M. Karamehmedović, P. Lehmann, S. Reichelt, R. Leach, and S. Piano. Journal of Computational Physics, (January 2025)Lens aberration compensation in interference microscopyR. Su, M. Thomas, M. Liu, J. Drs, Y. Bellouard, C. Pruss, J. Coupland, and R. Leach. Optics and Lasers in Engineering, (May 2020)Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer LevelY. Arezki, R. Su, V. Heikkinen, F. Leprete, P. Posta, Y. Bitou, C. Schober, C. Mehdi-Souzani, B. Alzahrani, X. Zhang and 7 other author(s). Sensors, 21 (4): 1103 (2021)Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrologyH. Hooshmand, P. Hansen, L. Fu, A. Birk, M. Karamehmedović, P. Lehmann, S. Reichelt, R. Leach, and S. Piano. Journal of computational physics, 521 (1): 113519 (2024)Lens aberration compensation in interference microscopyR. Su, M. Thomas, M. Liu, J. Drs, Y. Bellouard, C. Pruß, J. Coupland, and R. Leach. Optics and Lasers in Engineering, (2020)ICT Use in the Context of Electricity Access in a Developing Country: A Choice Framework Analysis.A. Bailey, A. Henry-Lee, Y. Johnson-Coke, R. Leach, A. Clayton, M. Gee, and O. Browne. ICT4D (1), volume 551 of IFIP Advances in Information and Communication Technology, page 27-38. Springer, (2019)Modelling the Interaction Forces between an Ideal Measurement Surface and the Stylus Tip of a Novel Vibrating Micro-scale CMM Probe.J. Claverley, A. Georgi, and R. Leach. IPAS, volume 315 of IFIP Advances in Information and Communication Technology, page 131-138. Springer, (2010)Semi-automated Assembly of a MEMS-Based Micro-scale CMM Probe and Future Optimization of the Process Chain with a View to Desktop Factory Automation.J. Claverley, A. Burisch, R. Leach, and A. Raatz. IPAS, volume 371 of IFIP Advances in Information and Communication Technology, page 9-16. Springer, (2012)External Shape Measurement for Industrial Applications Using Artificial Intelligence and Optimised Data Fusion.P. Stavroulakis, D. Sims-Waterhouse, A. Shaheen, S. Catalucci, P. Bointon, E. Doyen, Y. Bis-Kong, Y. Tzimiropoulos, and R. Leach. IntelliSys (2), volume 869 of Advances in Intelligent Systems and Computing, page 1273-1281. Springer, (2018)

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Disambiguation of "Leach, Richard"

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Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology

Please choose a person to relate this publication to

Richard Powers University of Stuttgart

Univ. -Prof. Dr. Richard Dipper University of Stuttgart

Richard Gozali University of Stuttgart

Richard Völker University of Stuttgart

Dr. -Ing. Richard Junesch University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Leach, Richard"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology

Please choose a person to relate this publication to

Richard Powers University of Stuttgart

Univ. -Prof. Dr. Richard Dipper University of Stuttgart

Richard Gozali University of Stuttgart

Richard Völker University of Stuttgart

Dr. -Ing. Richard Junesch University of Stuttgart

Other publications of authors with the same name

Disambiguation

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history of this post
URL
DOI
BibTeX
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Chicago
DIN 1505
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Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology