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Disambiguation of "Revil, Nathalie"

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Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation Model Limitations and Applications.

, and . Microelectronics Reliability, 41 (9-10): 1307-1312 (2001)

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Other publications of authors with the same name

0.13µm SiGe BiCMOS Technology Fully Dedicated to mm-Wave Applications., , , , , , , , , and 11 other author(s). J. Solid-State Circuits, 44 (9): 2312-2321 (2009)Injection Mechanisms and Lifetime Prediction with the Substrate Voltage in 0.15mum Channel-Length N-MOSFETs., , , and . Microelectronics Reliability, 41 (9-10): 1313-1318 (2001)Impact of inside spacer process on fully self-aligned 250 GHz SiGe: C HBTs reliability performances: a-Si vs. nitride., , , , , and . Microelectronics Reliability, 48 (8-9): 1198-1201 (2008)Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs., , , , , , , and . Microelectronics Reliability, 45 (9-11): 1370-1375 (2005)Hole injection enhanced hot-carrier degradation in PMOSFETs used for systems on chip applications with 6.5-2 nm thick gate-oxides., , , and . Microelectronics Reliability, 44 (1): 65-77 (2004)Carrier injection efficiency for the reliability study of 3.5-1.2 nm thick gate-oxide CMOS technologies., , , , and . Microelectronics Reliability, 43 (8): 1241-1246 (2003)Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation Model Limitations and Applications., and . Microelectronics Reliability, 41 (9-10): 1307-1312 (2001)A thorough investigation of MOSFETs NBTI degradation., , , , , , and . Microelectronics Reliability, 45 (1): 83-98 (2005)