%0 Journal Article %1 journals/mr/RevilG01 %A Revil, Nathalie %A Garros, Xavier %D 2001 %J Microelectronics Reliability %K dblp %N 9-10 %P 1307-1312 %T Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation Model Limitations and Applications. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#RevilG01 %V 41

@article{journals/mr/RevilG01, added-at = {2019-07-10T00:00:00.000+0200}, author = {Revil, Nathalie and Garros, Xavier}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e306e089144121a5d5399441f9e491fc/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00203-7}, interhash = {050d450b3b2d0cefa0ca9a2c6ba753cb}, intrahash = {e306e089144121a5d5399441f9e491fc}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-10}, pages = {1307-1312}, timestamp = {2019-09-27T10:58:15.000+0200}, title = {Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation Model Limitations and Applications.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#RevilG01}, volume = 41, year = 2001 }