PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Kamarinos, G."

Author of the publication

copydeleteadd this publication to your clipboard
Effects of hot carriers in offset gated polysilicon thin-film transistors.

, , , , and . Microelectronics Reliability, 46 (2-4): 311-316 (2006)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

G. Daiß

G. Wagner

Dr. Guido Reina University of Stuttgart

Pascal Goldschmid University of Stuttgart

Reinforcement learning based autonomous multi-rotor landing on moving platforms, and . Autonomous Robots, 48 (4): 13 (Jun 6, 2024)

Dipl.-Ing. Benjamin Greiner University of Stuttgart

 

Other publications of authors with the same name

Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors., , , , , and . Microelectronics Reliability, 43 (1): 57-60 (2003)Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors., , , , , , and . Microelectronics Reliability, 45 (2): 341-348 (2005)Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress., , , , , , and . Microelectronics Reliability, 48 (4): 531-536 (2008)Effects of hot carriers in offset gated polysilicon thin-film transistors., , , , and . Microelectronics Reliability, 46 (2-4): 311-316 (2006)Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors., , , and . Microelectronics Reliability, 43 (4): 671-674 (2003)Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors., , , , and . Microelectronics Reliability, 46 (12): 2032-2037 (2006)Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors., , , , , and . Microelectronics Reliability, 51 (3): 556-559 (2011)