%0 Journal Article %1 journals/mr/WelBBHW07 %A van der Wel, P. J. %A de Beer, J. R. %A van Boxtel, R. J. M. %A Hsieh, Y. Y. %A Wang, Y. C. %D 2007 %J Microelectronics Reliability %K dblp %N 8 %P 1188-1193 %T Effect of oval defects in GaAs on the reliability of SiNx metal-insulator-metal capacitors. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#WelBBHW07 %V 47

@article{journals/mr/WelBBHW07, added-at = {2010-09-16T00:00:00.000+0200}, author = {van der Wel, P. J. and de Beer, J. R. and van Boxtel, R. J. M. and Hsieh, Y. Y. and Wang, Y. C.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2cffb0f68fdc6010100024d6a4abf8a58/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2007.01.089}, interhash = {a2774b0dbcc06e3b7890563a8a7d0259}, intrahash = {cffb0f68fdc6010100024d6a4abf8a58}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 8, pages = {1188-1193}, timestamp = {2016-02-02T02:01:55.000+0100}, title = {Effect of oval defects in GaAs on the reliability of SiNx metal-insulator-metal capacitors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#WelBBHW07}, volume = 47, year = 2007 }