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%0 Journal Article
%1 journals/mr/ChenNAaRMNLM16
%A Chen, C. Q.
%A Ng, P. T.
%A Ang, G. B.
%A Tan, H.
%A Rivai, Francis
%A Ma, Y. Z.
%A Ng, H. P.
%A Lam, Jeffery
%A Mai, Z. H.
%D 2016
%J Microelectronics Reliability
%K dblp
%P 317-320
%T Electrical analysis on implantation-related defect by nanoprobing methodology.
%U http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChenNAaRMNLM16
%V 64
@article{journals/mr/ChenNAaRMNLM16,
added-at = {2016-12-23T00:00:00.000+0100},
author = {Chen, C. Q. and Ng, P. T. and Ang, G. B. and Tan, H. and Rivai, Francis and Ma, Y. Z. and Ng, H. P. and Lam, Jeffery and Mai, Z. H.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26da26589ef8f91e57dc38a4a0f661d02/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2016.07.091},
interhash = {8a2cb3bc0c22375abe75cfb6251a9b7d},
intrahash = {6da26589ef8f91e57dc38a4a0f661d02},
journal = {Microelectronics Reliability},
keywords = {dblp},
pages = {317-320},
timestamp = {2016-12-24T10:32:08.000+0100},
title = {Electrical analysis on implantation-related defect by nanoprobing methodology.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChenNAaRMNLM16},
volume = 64,
year = 2016
}
