%0 Journal Article %1 gholve2023carat %A Gholve, Prasad %A Chatterjee, Payel %A Pasupuleti, Chaitanya %A Amrouch, Hussam %A Gangwar, Narendra %A Das, Shouvik %A Sharma, Uma %A Santen, Victor van %A Mahapatra, Souvik %D 2023 %I Pergamon %J Solid state electronics %K %N March %P 108586 %R 10.1016/j.sse.2022.108586 %T CARAT : A reliability analysis framework for BTI-HCD aging in circuits %V 201

@article{gholve2023carat, added-at = {2023-11-24T10:16:23.000+0100}, affiliation = {Chatterjee, P (Corresponding Author), Indian Inst Technol, Dept Elect Engn, Mumbai 400076, India. Gholve, Prasad; Chatterjee, Payel; Pasupuleti, Chaitanya; Gangwar, Narendra; Das, Shouvik; Sharma, Uma; Mahapatra, Souvik, Indian Inst Technol, Dept Elect Engn, Mumbai 400076, India. Amrouch, Hussam; van Santen, Victor M., Univ Stuttgart, Inst Comp Architecture \& Comp Engn, Stuttgart, Germany.}, author = {Gholve, Prasad and Chatterjee, Payel and Pasupuleti, Chaitanya and Amrouch, Hussam and Gangwar, Narendra and Das, Shouvik and Sharma, Uma and Santen, Victor van and Mahapatra, Souvik}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26623e7b3f454db26f388182eb68449bc/unibiblio}, doi = {10.1016/j.sse.2022.108586}, interhash = {7fe32ad42c99d21ff71df4b5ed87588d}, intrahash = {6623e7b3f454db26f388182eb68449bc}, issn = {{1879-2405} and {0038-1101}}, journal = {Solid state electronics}, keywords = {}, language = {eng}, number = {March}, pages = 108586, publisher = {Pergamon}, research-areas = {Engineering; Physics}, timestamp = {2023-11-24T09:16:23.000+0100}, title = {CARAT : A reliability analysis framework for BTI-HCD aging in circuits}, unique-id = {WOS:000990602800001}, volume = 201, year = 2023 }