IEEE journal on emerging and selected topics in circuits and systems
number
1
pages
86-95
publisher
IEEE
volume
13
research-areas
Engineering
language
eng
issn
2156-3357 and 2156-3365
affiliation
Paim, G (Corresponding Author), Univ Fed Rio Grande Sul UFRGS, Inst Informat INF, Grad Program Microelect PGMICRO, BR-91501970 Porto Alegre, Brazil.
de Abreu, Brunno Alves; Paim, Guilherme; Bampi, Sergio, Univ Fed Rio Grande Sul UFRGS, Inst Informat INF, Grad Program Microelect PGMICRO, BR-91501970 Porto Alegre, Brazil.
de Abreu, Brunno Alves; Paim, Guilherme; Flores, Paulo, Inst Engn Sistemas & Comp Invest & Desenvolvimento, High Performance Comp Architectures & Syst HPCAS, P-1000029 Lisbon, Portugal.
Mema, Albi; Thomann, Simon; Amrouch, Hussam, Univ Stuttgart, Chair Semicond Test & Reliabil STAR, D-70174 Stuttgart, Germany.
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%0 Journal Article
%1 abreu2023compact
%A Abreu, Brunno Alves de
%A Mema, Albi
%A Thomann, Simon
%A Paim, Guilherme
%A Flores, Paulo
%A Bampi, Sergio
%A Amrouch, Hussam
%D 2023
%I IEEE
%J IEEE journal on emerging and selected topics in circuits and systems
%K
%N 1
%P 86-95
%R 10.1109/JETCAS.2023.3243150
%T Compact CMOS-Compatible Majority Gate Using Body Biasing in FDSOI Technology
%V 13
@article{abreu2023compact,
added-at = {2023-12-21T14:50:35.000+0100},
affiliation = {Paim, G (Corresponding Author), Univ Fed Rio Grande Sul UFRGS, Inst Informat INF, Grad Program Microelect PGMICRO, BR-91501970 Porto Alegre, Brazil.
de Abreu, Brunno Alves; Paim, Guilherme; Bampi, Sergio, Univ Fed Rio Grande Sul UFRGS, Inst Informat INF, Grad Program Microelect PGMICRO, BR-91501970 Porto Alegre, Brazil.
de Abreu, Brunno Alves; Paim, Guilherme; Flores, Paulo, Inst Engn Sistemas & Comp Invest & Desenvolvimento, High Performance Comp Architectures & Syst HPCAS, P-1000029 Lisbon, Portugal.
Mema, Albi; Thomann, Simon; Amrouch, Hussam, Univ Stuttgart, Chair Semicond Test & Reliabil STAR, D-70174 Stuttgart, Germany.},
author = {Abreu, Brunno Alves de and Mema, Albi and Thomann, Simon and Paim, Guilherme and Flores, Paulo and Bampi, Sergio and Amrouch, Hussam},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a22ad6a2bfff76a48e280fd39fd22a7f/unibiblio},
doi = {10.1109/JETCAS.2023.3243150},
interhash = {549d6adc1d358d97b93b025b820aa29f},
intrahash = {a22ad6a2bfff76a48e280fd39fd22a7f},
issn = {{2156-3357} and {2156-3365}},
journal = {IEEE journal on emerging and selected topics in circuits and systems},
keywords = {},
language = {eng},
number = 1,
orcid-numbers = {Mema, Albi/0000-0001-7841-1975
Paim, Guilherme/0000-0001-7809-9563
Thomann, Simon/0000-0002-7902-9353},
pages = {86-95},
publisher = {IEEE},
research-areas = {Engineering},
timestamp = {2023-12-21T13:50:35.000+0100},
title = {Compact CMOS-Compatible Majority Gate Using Body Biasing in FDSOI Technology},
unique-id = {WOS:000967354700001},
volume = 13,
year = 2023
}