%0 Conference Paper %1 conf/iscas/VasudevanNAV10 %A Vasudevan, Barath %A Niamat, Mohammed Y. %A Alam, Mansoor %A Vemuru, Srinivasa %B ISCAS %D 2010 %I IEEE %K dblp %P 3905-3908 %T Analysis and test of electromigration failures in FPGAs. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2010.html#VasudevanNAV10 %@ 978-1-4244-5309-2

@inproceedings{conf/iscas/VasudevanNAV10, added-at = {2011-04-14T00:00:00.000+0200}, author = {Vasudevan, Barath and Niamat, Mohammed Y. and Alam, Mansoor and Vemuru, Srinivasa}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/204ab9c2a78cf203a777bdea3846ab7b5/dblp}, booktitle = {ISCAS}, crossref = {conf/iscas/2010}, ee = {http://dx.doi.org/10.1109/ISCAS.2010.5537680}, interhash = {4d387c21aab6b4920f59c709086e17b0}, intrahash = {04ab9c2a78cf203a777bdea3846ab7b5}, isbn = {978-1-4244-5309-2}, keywords = {dblp}, pages = {3905-3908}, publisher = {IEEE}, timestamp = {2016-05-21T09:43:17.000+0200}, title = {Analysis and test of electromigration failures in FPGAs.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2010.html#VasudevanNAV10}, year = 2010 }