%0 Conference Proceedings
%1 streibl2009setup
%A Streibl, Franz
%A Tenbohlen, Stefan
%A Hartmann, J.
%A Dudenhoeffer, E.
%D 2009
%K Components Derating ESD Measuring SMD Stress
%T Setup for Measuring the Derating of SMD Components under ESD Stress
@proceedings{streibl2009setup,
added-at = {2020-06-29T14:33:16.000+0200},
author = {Streibl, Franz and Tenbohlen, Stefan and Hartmann, J. and Dudenhoeffer, E.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e30eb6d85b24ab9ea91d1972147357f6/annettegugel},
eventdate = {January 12-16},
eventtitle = {20th International Zurich Symposium on Electromagnetic Compatibility},
interhash = {0f33b8197577809bda90dd47cdf43bae},
intrahash = {e30eb6d85b24ab9ea91d1972147357f6},
keywords = {Components Derating ESD Measuring SMD Stress},
timestamp = {2020-06-29T12:39:07.000+0200},
title = {Setup for Measuring the Derating of SMD Components under ESD Stress},
venue = {Zurich, Switzerland},
year = 2009
}