%0 Conference Paper %1 schnitzler2024gatesourcedependent %A Schnitzler, Ruben %A Koch, Dominik %A Weiser, Mathias %A Weimer, Julian %A Kallfass, Ingmar %B 2024 IEEE Applied Power Electronics Conference and Exposition (APEC) %D 2024 %I IEEE %K sent ubs_10005 ubs_20007 ubs_30076 ubs_40346 unibibliografie %P 1100-1107 %R 10.1109/APEC48139.2024.10509381 %T Gate-Source-Dependent Soft- and Hard-Switching Losses of 1200V SiC MOSFETs Utilizing Heatsinkless Calorimetric Measurements Based on Optical Sensors %@ 979-8-3503-1664-3 and 979-8-3503-1663-6 and 979-8-3503-1665-0

@inproceedings{schnitzler2024gatesourcedependent, added-at = {2025-01-31T16:29:11.000+0100}, author = {Schnitzler, Ruben and Koch, Dominik and Weiser, Mathias and Weimer, Julian and Kallfass, Ingmar}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d0228c37cda327870600d5446cfe2f62/unibiblio}, booktitle = {2024 IEEE Applied Power Electronics Conference and Exposition (APEC)}, doi = {10.1109/APEC48139.2024.10509381}, eventdate = {2024-02-25/2024-02-29}, eventtitle = {2024 IEEE Applied Power Electronics Conference and Exposition (APEC)}, interhash = {4d7c66d6996caf768b042a533a07c8e1}, intrahash = {d0228c37cda327870600d5446cfe2f62}, isbn = {{979-8-3503-1664-3} and {979-8-3503-1663-6} and {979-8-3503-1665-0}}, keywords = {sent ubs_10005 ubs_20007 ubs_30076 ubs_40346 unibibliografie}, language = {eng}, pages = {1100-1107}, publisher = {IEEE}, timestamp = {2025-01-31T16:29:11.000+0100}, title = {Gate-Source-Dependent Soft- and Hard-Switching Losses of 1200V SiC MOSFETs Utilizing Heatsinkless Calorimetric Measurements Based on Optical Sensors}, venue = {Long Beach, USA}, year = 2024 }