Integration of electrically detected magnetic resonance on a chip (EDMRoC) with charge pumping for low-cost and sensitive defect characterization in silicon carbide metal–oxide–semiconductor field-effect transistors
%0 Journal Article
%1 Lettens_2025
%A Lettens, Jan
%A Avramenko, Marina
%A Vandevenne, Ilias
%A Chu, Anh
%A Hengel, Philipp
%A Kern, Michal
%A Anders, Jens
%A Moens, Peter
%A Goovaerts, Etienne
%A Cambré, Sofie
%D 2025
%I AIP Publishing
%J Journal of Applied Physics
%K myown
%N 6
%R 10.1063/5.0245349
%T Integration of electrically detected magnetic resonance on a chip (EDMRoC) with charge pumping for low-cost and sensitive defect characterization in silicon carbide metal–oxide–semiconductor field-effect transistors
%U http://dx.doi.org/10.1063/5.0245349
%V 137
@article{Lettens_2025,
added-at = {2025-02-13T13:26:34.000+0100},
author = {Lettens, Jan and Avramenko, Marina and Vandevenne, Ilias and Chu, Anh and Hengel, Philipp and Kern, Michal and Anders, Jens and Moens, Peter and Goovaerts, Etienne and Cambré, Sofie},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ad06f90affc62728cbb9045243007e14/iis},
doi = {10.1063/5.0245349},
interhash = {3730050d9bb5d1575887729e7d1bc3b2},
intrahash = {ad06f90affc62728cbb9045243007e14},
issn = {1089-7550},
journal = {Journal of Applied Physics},
keywords = {myown},
month = feb,
number = 6,
publisher = {AIP Publishing},
timestamp = {2025-02-13T13:26:34.000+0100},
title = {Integration of electrically detected magnetic resonance on a chip (EDMRoC) with charge pumping for low-cost and sensitive defect characterization in silicon carbide metal–oxide–semiconductor field-effect transistors},
url = {http://dx.doi.org/10.1063/5.0245349},
volume = 137,
year = 2025
}
