Comparison of Gate-Source-Dependent Soft- and Hard-Switching Losses of Wide-Bandgap Semiconductor Utilizing Electrical and Rapid Heatsinkless Calorimetric Measurements
%0 Journal Article
%1 Schnitzler_APEC2024
%A Schnitzler, R.
%A Koch, D
%A Weiser, M.
%A Weimer, J.
%A Kallfass, I
%D 2024
%J in Proc. Applied Power Electronics Conference (APEC), Long Beach
%K PUMA in update
%T Comparison of Gate-Source-Dependent Soft- and Hard-Switching Losses of Wide-Bandgap Semiconductor Utilizing Electrical and Rapid Heatsinkless Calorimetric Measurements
@article{Schnitzler_APEC2024,
added-at = {2025-05-26T10:46:09.000+0200},
author = {Schnitzler, R. and Koch, D and Weiser, M. and Weimer, J. and Kallfass, I},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2643d3dd1f1a5b8f7f9f291ce8846f206/ingmarkallfass},
date-added = {2023-12-08 14:16:55 +0100},
date-modified = {2023-12-08 14:17:35 +0100},
interhash = {7023fc9f177b6ad66f4cd91c8321c41d},
intrahash = {643d3dd1f1a5b8f7f9f291ce8846f206},
journal = {in Proc. Applied Power Electronics Conference (APEC), Long Beach},
keywords = {PUMA in update},
month = {Feb.},
timestamp = {2025-05-26T10:46:09.000+0200},
title = {Comparison of Gate-Source-Dependent Soft- and Hard-Switching Losses of Wide-Bandgap Semiconductor Utilizing Electrical and Rapid Heatsinkless Calorimetric Measurements},
year = 2024
}
