%0 Conference Paper %1 noauthororeditor %A Benz, Achim %A Uhl, Clemens %A Dazer, Martin %A Knoch, Jan %B RAMS 2025 Proceedings of Annual Reliability and Maintainablity Symposium %D 2025 %I IEEE %K zuverlässigkeitstechnik A_Benz M_Dazer %R 10.1109/RAMS48127.2025.10935272 %T A Two-Phase Arrhenius Model for Film Capacitors for Large Temperature Ranges %@ 979-8-3503-6774-4

@inproceedings{noauthororeditor, added-at = {2025-04-16T13:01:45.000+0200}, author = {Benz, Achim and Uhl, Clemens and Dazer, Martin and Knoch, Jan}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/241f0ee228269b71dd4567a04058e6817/ima-publ}, booktitle = {RAMS 2025 Proceedings of Annual Reliability and Maintainablity Symposium}, description = {(peer-review);}, doi = {10.1109/RAMS48127.2025.10935272}, eventdate = {27.01.-30.01.2025}, eventtitle = {RAMS 2025}, interhash = {02df96216610e364f39c2082df147900}, intrahash = {41f0ee228269b71dd4567a04058e6817}, isbn = {979-8-3503-6774-4}, issn = {2577-0993}, keywords = {zuverlässigkeitstechnik A_Benz M_Dazer}, publisher = {IEEE}, timestamp = {2025-04-16T13:01:45.000+0200}, title = {A Two-Phase Arrhenius Model for Film Capacitors for Large Temperature Ranges}, venue = {Miramar Beach, FL, USA}, year = 2025 }