%0 Conference Paper %1 elhamawy2024scenariobased %A Elhamawy, Nourhan %A Anders, Jens %A Polian, Ilia %A Sauer, Matthias %B 2024 IEEE 42nd VLSI Test Symposium (VTS) %C Piscataway, NJ] %D 2024 %E Traiola, Marcello %I IEEE %K %P 1-7 %R 10.1109/VTS60656.2024.10538586 %T Scenario-based Test Content Optimization: Scan Test vs. System-Level Test %@ 979-8-3503-6378-4 and 979-8-3503-6379-1

@inproceedings{elhamawy2024scenariobased, added-at = {2025-01-28T11:00:56.000+0100}, address = {Piscataway, NJ]}, affiliation = {Elhamawy, N (Corresponding Author), Univ Stuttgart, Inst Smart Sensors, Stuttgart, Germany. Elhamawy, Nourhan; Anders, Jens, Univ Stuttgart, Inst Smart Sensors, Stuttgart, Germany. Elhamawy, Nourhan; Polian, Ilia, Univ Stuttgart, Inst Comp Engn \& Comp Architecture, Stuttgart, Germany. Sauer, Matthias, Advantest Europe, E Kilbride, Scotland.}, affiliations = {University of Stuttgart; University of Stuttgart}, author = {Elhamawy, Nourhan and Anders, Jens and Polian, Ilia and Sauer, Matthias}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26c846c504222681aae4d4c3b5ae5b9be/unibiblio}, booktitle = {2024 IEEE 42nd VLSI Test Symposium (VTS)}, doi = {10.1109/VTS60656.2024.10538586}, editor = {Traiola, Marcello}, eventdate = {2024-04-22/2024-04-24}, eventtitle = {42nd VLSI Test Symposium (VTS)}, interhash = {23ca5ce0ff53f9b53b746d8438ef4f05}, intrahash = {6c846c504222681aae4d4c3b5ae5b9be}, isbn = {{979-8-3503-6378-4} and {979-8-3503-6379-1}}, keywords = {}, language = {eng}, pages = {1-7}, publisher = {IEEE}, research-areas = {Computer Science; Engineering}, timestamp = {2025-01-28T10:00:56.000+0100}, title = {Scenario-based Test Content Optimization: Scan Test vs. System-Level Test}, unique-id = {WOS:001239933000010}, venue = {Tempe, AZ, USA}, year = 2024 }