%0 Conference Paper
%1 kamm2022simulationtoreality
%A Kamm, Simon
%A Bickelhaupt, Sandra
%A Sharma, Kanuj
%A Jazdi-Motlagh, Nasser
%A Kallfass, Ingmar
%A Weyrich, Michael
%B 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)
%C Piscataway
%D 2022
%I IEEE
%K mult ubs_10005 ubs_20007 ubs_30076 ubs_30175 ubs_40346 ubs_40357 unibibliografie wos
%R 10.1109/ETFA52439.2022.9921681
%T Simulation-to-Reality based Transfer Learning for the Failure Analysis
of SiC Power Transistors
%@ 978-1-6654-9996-5 and 978-1-6654-9997-2
@inproceedings{kamm2022simulationtoreality,
added-at = {2023-10-17T14:27:31.000+0200},
address = {Piscataway},
affiliation = {Kamm, S (Corresponding Author), Univ Stuttgart, Inst Ind Automat \& Software Engn, Pfaffenwaldring 47, Stuttgart, Germany.
Kamm, Simon; Bickelhaupt, Sandra; Jazdi, Nasser; Weyrich, Michael, Univ Stuttgart, Inst Ind Automat \& Software Engn, Pfaffenwaldring 47, Stuttgart, Germany.
Sharma, Kanuj; Kallfass, Ingmar, Univ Stuttgart, Inst Robust Power Semicond Syst, Pfaffenwaldring 47, Stuttgart, Germany.},
author = {Kamm, Simon and Bickelhaupt, Sandra and Sharma, Kanuj and Jazdi-Motlagh, Nasser and Kallfass, Ingmar and Weyrich, Michael},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23c3c3d76baa49d1d19674aa969f7e0a3/unibiblio},
booktitle = {2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)},
doi = {10.1109/ETFA52439.2022.9921681},
interhash = {db3591a67b85c4d917404d172151cfb8},
intrahash = {3c3c3d76baa49d1d19674aa969f7e0a3},
isbn = {{978-1-6654-9996-5} and {978-1-6654-9997-2}},
keywords = {mult ubs_10005 ubs_20007 ubs_30076 ubs_30175 ubs_40346 ubs_40357 unibibliografie wos},
language = {eng},
publisher = {IEEE},
research-areas = {Automation \& Control Systems; Engineering},
timestamp = {2023-10-17T14:27:31.000+0200},
title = {Simulation-to-Reality based Transfer Learning for the Failure Analysis
of SiC Power Transistors},
unique-id = {WOS:000934103900223},
venue = {Stuttgart},
year = 2022
}