%0 Conference Paper %1 schnitzler2023fully %A Schnitzler, Ruben %A Koch, Dominik %A Dos Santos Gomes, Erine %A Kallfass, Ingmar %B 2023 IEEE Design Methodologies Conference (DMC) %D 2023 %I IEEE %K ubs_30076 unibibliografie sent ubs_20007 ubs_10005 ubs_40346 %R 10.1109/DMC58182.2023.10412598 %T Fully Modular, Dynamic SiC and GaN Testbench with Automated Temperature and Gate-Voltage Characterization %@ 979-8-3503-1554-7 and 979-8-3503-1555-4

@inproceedings{schnitzler2023fully, added-at = {2024-12-05T13:41:12.000+0100}, author = {Schnitzler, Ruben and Koch, Dominik and Dos Santos Gomes, Erine and Kallfass, Ingmar}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/238ef5e64c53e768afd92e1c7ac95f8ba/unibiblio}, booktitle = {2023 IEEE Design Methodologies Conference (DMC)}, doi = {10.1109/DMC58182.2023.10412598}, eventdate = {2023-09-24/2023-09-26}, eventtitle = {2023 IEEE Design Methodologies Conference (DMC)}, interhash = {872ea149b7ac1fb60033a059d5870453}, intrahash = {38ef5e64c53e768afd92e1c7ac95f8ba}, isbn = {{979-8-3503-1554-7} and {979-8-3503-1555-4}}, keywords = {ubs_30076 unibibliografie sent ubs_20007 ubs_10005 ubs_40346}, language = {eng}, publisher = {IEEE}, timestamp = {2024-12-10T15:04:56.000+0100}, title = {Fully Modular, Dynamic SiC and GaN Testbench with Automated Temperature and Gate-Voltage Characterization}, venue = {Miami, USA}, year = 2023 }