%0 Conference Paper %1 conf/iccad/AcarO05 %A Acar, Erkan %A Ozev, Sule %B ICCAD %D 2005 %I IEEE Computer Society %K dblp %P 73-79 %T Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2005.html#AcarO05 %@ 0-7803-9254-X

@inproceedings{conf/iccad/AcarO05, added-at = {2015-05-01T00:00:00.000+0200}, author = {Acar, Erkan and Ozev, Sule}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/286de30f5c8a42fb25455970ffe867180/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2005}, ee = {http://dl.acm.org/citation.cfm?id=1129614}, interhash = {f9e3fcc95c10e7f58a1d6b55ab5f34cc}, intrahash = {86de30f5c8a42fb25455970ffe867180}, isbn = {0-7803-9254-X}, keywords = {dblp}, pages = {73-79}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T13:49:19.000+0100}, title = {Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2005.html#AcarO05}, year = 2005 }