%0 Journal Article %1 journals/mr/BrahmaBGS04 %A Brahma, Sanjib Kumar %A Boit, Christian %A Glowacki, Arkadiusz %A Suzuki, Hiroyoshi %D 2004 %J Microelectronics Reliability %K dblp %N 9-11 %P 1699-1702 %T Localization of FET Device Performance with Thermal Laser Stimulation. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#BrahmaBGS04 %V 44

@article{journals/mr/BrahmaBGS04, added-at = {2015-02-05T00:00:00.000+0100}, author = {Brahma, Sanjib Kumar and Boit, Christian and Glowacki, Arkadiusz and Suzuki, Hiroyoshi}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22372ef5d437939e0d1a1533bbca3fba0/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2004.07.056}, interhash = {f905a6c1632ae8717cf0952eee683a1a}, intrahash = {2372ef5d437939e0d1a1533bbca3fba0}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1699-1702}, timestamp = {2016-02-02T02:00:42.000+0100}, title = {Localization of FET Device Performance with Thermal Laser Stimulation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#BrahmaBGS04}, volume = 44, year = 2004 }